Title :
Thermoresistive sensor parameters from its static I×V characteristics
Author :
Oliveira, A. ; Neto, J. S Rocha ; Deep, G.S. ; Freire, R.C.S.
Author_Institution :
UFBA, Campina Grande, Brazil
Abstract :
The temperature coefficient of resistance and the global heat transfer coefficient of a thermoresistive sensor are two of its important parameters. A method for estimation of these parameters from a single experimental Is×Vs curve using a numerical algorithm is proposed. Simulation and experimental results are presented
Keywords :
characteristics measurement; curve fitting; electric sensing devices; least mean squares methods; linear algebra; parameter estimation; resistance thermometers; semiconductor device models; semiconductor device noise; temperature sensors; thermistors; thin film resistors; white noise; global heat transfer coefficient; linear regression; numerical algorithm; parameter estimation method; resistance thermometers; simulation; static I-V characteristics; temperature coefficient of resistance; thermistors; thermoresistive sensor parameters; white noise; Electric resistance; Equations; Heat transfer; Parameter estimation; Resistance heating; Sensor phenomena and characterization; Temperature sensors; Thermal resistance; Thermal sensors; Thermoresistivity;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
DOI :
10.1109/IMTC.1996.507450
