Title :
Exploiting temporal decoupling to accelerate trace-driven NoC emulation
Author :
Krishnaiah, Gummidipudi ; Silpa, B.V.N. ; Panda, Preeti Ranjan ; Kumar, Anshul
Author_Institution :
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol. Delhi, New Delhi, India
Abstract :
The need for hardware acceleration of Network-on-Chip (NoC) simulation has been motivated by their growing complexity and large design space. NoC simulation can exploit the inherent concurrency in hardware by using FPGA based emulators. For trace-driven NoC emulators, we enhance this raw hardware speedup by exploiting the traffic characteristics for a more efficient utilization of hardware. We propose a technique, OTO-NoC-Sim, to reduce NoC emulation time by scheduling network transactions in an out-of-time order. Our simulation technique addresses the challenges arising out of an out-of-time-order scheduling in maintaining the correctness of statistics measured. Our experiments indicate that our proposed technique reduces the average emulation time by 3× for multi-threaded applications and by 3.5× for multi-programmed benchmarks when compared to a conventional FPGA emulation.
Keywords :
field programmable gate arrays; multi-threading; multiprocessing programs; network-on-chip; processor scheduling; terminal emulation; FPGA based emulator; OTO-NoC-Sim; design space; hardware acceleration; hardware utilization; multiprogrammed benchmark; multithreaded application; network transaction scheduling; network-on-chip simulation technique; out-of-time-order scheduling; raw hardware speedup; temporal decoupling; trace driven NoC emulation time reduction; traffic characteristics; Acceleration; Clocks; Emulation; Field programmable gate arrays; Hardware; Synchronization; Transmitters; FPGA Emulation; Hardware Acceleration; Network-on-Chip; Performance Analysis; Trace-driven Simulation;
Conference_Titel :
Hardware/Software Codesign and System Synthesis (CODES+ISSS), 2011 Proceedings of the 9th International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4503-0715-4