Title :
Sub-poissonian noise signatures in the carrier-envelope phase jitter of highly stabilized mode-locked lasers
Author :
Koke, Sebastian ; Borchers, Bastian ; Grebing, Christian ; Frei, Harald ; Anderson, Alexandria ; Assion, Andreas ; Steinmeyer, Günter
Author_Institution :
Max-Born-Inst., Berlin, Germany
Abstract :
Measurement and stabilization of the carrier-envelope phase (CEP) drift of femtosecond pulse trains has found widespread application in frequency metrology and high-field nonlinear optics. Stabilization of the CEP is typically accomplished in a feedback loop, acting on the pump power with a wide-bandwidth modulator. This stabilization strongly relies on the fact that a change of intracavity laser power results in a proportional change of the carrier envelope frequency fCE. This proportionality may be turned around, with fCE acting as a probe for the laser intracavity power. Doing so, we find that this novel method of intracavity power measurements is not limited by standard shot noise, with a sensitivity of the method down to -17 dB (i.e., a factor 50) below the shot noise floor of conventional photodetection in a photodiode or similar absorptive devices. This opens a perspective for highly sensitive interferometry applications.
Keywords :
jitter; laser mode locking; laser noise; laser stability; shot noise; carrier envelope frequency; carrier-envelope phase drift; carrier-envelope phase jitter; feedback loop; femtosecond pulse trains; frequency metrology; high-field nonlinear optics; highly stabilized mode-locked lasers; intracavity laser power; intracavity power measurements; photodiode; pump power; shot noise floor; standard shot noise; sub-Poissonian noise signatures; wide-bandwidth modulator; Frequency measurement; Frequency modulation; Laser noise; Measurement by laser beam; Noise measurement; Power measurement;
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4577-0533-5
Electronic_ISBN :
Pending
DOI :
10.1109/CLEOE.2011.5943517