DocumentCode
2080719
Title
Phase-based brain consciousness analysis
Author
Ling Li ; Looney, David ; Cheolsoo Park ; Tanaka, T. ; Jianting Cao ; Mandic, Danilo P.
Author_Institution
Sch. of Comput., Univ. of Kent, Canterbury, UK
fYear
2012
fDate
Aug. 28 2012-Sept. 1 2012
Firstpage
1032
Lastpage
1035
Abstract
This work provides a novel framework for identifying coma and brain death consciousness states by analysing frequency power and phase synchrony features from electroencephalogram (EEG). The proposed analysis of pairs of EEG electrodes using complex extensions of Empirical Mode Decomposition (EMD) permits the extraction of information related to the state of the brain function. Analysis on 34 subjects in the coma and quasi-brain-death states suggests that phase synchrony constitutes a feasible feature to discriminate quasi-brain-death from coma state. Thus, illustrate the effectiveness of the proposed methods for brain consciousness identification. The predictive power of the features extracted is evaluated by building classification models using support vector machine (SVM) and evaluation the models through receiver operating characteristic (ROC) analysis.
Keywords
biomedical electrodes; electroencephalography; feature extraction; medical signal processing; sensitivity analysis; signal classification; support vector machines; EEG electrodes; ROC analysis; SVM; brain function; classification models; coma; electroencephalogram; empirical mode decomposition; frequency power; information feature extraction; phase synchrony features; phase-based brain consciousness analysis; receiver operating characteristic analysis; support vector machine; Electrodes; Electroencephalography; Feature extraction; Frequency synchronization; Support vector machines; Automatic Data Processing; Brain Death; Consciousness; Electroencephalography; Female; Humans; Male; Predictive Value of Tests; ROC Curve;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location
San Diego, CA
ISSN
1557-170X
Print_ISBN
978-1-4244-4119-8
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/EMBC.2012.6346110
Filename
6346110
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