• DocumentCode
    2080771
  • Title

    An effective feature extraction method for facial expression recognition using adaptive Gabor wavelet

  • Author

    Oshidari, B. ; Araabi, Babak N.

  • Author_Institution
    Control & Intell. Process. Center of Excellence, Univ. of Tehran, Tehran, Iran
  • Volume
    2
  • fYear
    2010
  • fDate
    10-12 Dec. 2010
  • Firstpage
    776
  • Lastpage
    780
  • Abstract
    Feature extraction is an important and challenging phase of facial expression recognition problem. In this paper, an effective feature extraction method is proposed. Our facial feature representation method is based on an adaptive Gabor wavelet transform. In this method, we used a fuzzy controller for tuning the orientation parameter of filter. This filter can detect the most significant edges of facial images. Furthermore, the proposed adaptive filter improves the drawbacks of conventional Gabor filters. Nearest neighbor and multi-class Support Vector Machine (SVM) classifiers are applied for classification task. Experimental results on Japanese Female Facial Expression (JAFFE) database show that the proposed method can provide high recognition rate. The main advantage of proposed method over other methods is its flexibility.
  • Keywords
    Gabor filters; face recognition; feature extraction; fuzzy set theory; support vector machines; wavelet transforms; Gabor filters; JAFFE; Japanese female facial expression; SVM; adaptive Gabor wavelet; effective feature extraction method; facial expression recognition; feature representation method; fuzzy controller; orientation parameter; support vector machine; Classification algorithms; Face recognition; Feature extraction; Gabor filters; Iron; Support vector machines; Transforms; adaptive Gabor wavelet transform; facial expression recognition; fuzzy controller; multi-class support vector machine classifier; nearest neighbor classifier;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Progress in Informatics and Computing (PIC), 2010 IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-6788-4
  • Type

    conf

  • DOI
    10.1109/PIC.2010.5688016
  • Filename
    5688016