• DocumentCode
    2080983
  • Title

    Effects of humidity on electric field distribution in polyimide insulation in microelectronics applications

  • Author

    Bloss, Peter ; De Reggi, Aimé S. ; SCHÄFER, Hartmut

  • Author_Institution
    Polymers Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    1
  • fYear
    1997
  • fDate
    19-22, Oct 1997
  • Firstpage
    275
  • Abstract
    With large scale integration in microelectronics, the thickness of insulation between closely spaced conductors at different potentials is reduced to the micrometer range and the electric field in the insulation becomes both a performance issue and a reliability issue. Using the thermal pulse method, we have measured for the first time the field distribution in 5 μm thick polyimide and found complex charging behaviour at ambient temperature and low field (circa 3 V/μm) representative of operating conditions. Field-independent charge layers are observed on the front surface in addition to injected charge extending deep into the bulk from the polyimide/substrate interface. These effects are considerably influenced by moisture uptake
  • Keywords
    environmental degradation; humidity; integrated circuit technology; large scale integration; organic insulating materials; polymer films; charging; electric field distribution; humidity; large scale integration; microelectronics; moisture; polyimide insulation; reliability; substrate interface; thermal pulse method; Conductors; Dielectrics and electrical insulation; Humidity; Large scale integration; Microelectronics; Polyimides; Pulse measurements; Temperature distribution; Thickness measurement; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
  • Conference_Location
    Minneapolis, MN
  • Print_ISBN
    0-7803-3851-0
  • Type

    conf

  • DOI
    10.1109/CEIDP.1997.634612
  • Filename
    634612