DocumentCode
2080983
Title
Effects of humidity on electric field distribution in polyimide insulation in microelectronics applications
Author
Bloss, Peter ; De Reggi, Aimé S. ; SCHÄFER, Hartmut
Author_Institution
Polymers Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume
1
fYear
1997
fDate
19-22, Oct 1997
Firstpage
275
Abstract
With large scale integration in microelectronics, the thickness of insulation between closely spaced conductors at different potentials is reduced to the micrometer range and the electric field in the insulation becomes both a performance issue and a reliability issue. Using the thermal pulse method, we have measured for the first time the field distribution in 5 μm thick polyimide and found complex charging behaviour at ambient temperature and low field (circa 3 V/μm) representative of operating conditions. Field-independent charge layers are observed on the front surface in addition to injected charge extending deep into the bulk from the polyimide/substrate interface. These effects are considerably influenced by moisture uptake
Keywords
environmental degradation; humidity; integrated circuit technology; large scale integration; organic insulating materials; polymer films; charging; electric field distribution; humidity; large scale integration; microelectronics; moisture; polyimide insulation; reliability; substrate interface; thermal pulse method; Conductors; Dielectrics and electrical insulation; Humidity; Large scale integration; Microelectronics; Polyimides; Pulse measurements; Temperature distribution; Thickness measurement; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
Conference_Location
Minneapolis, MN
Print_ISBN
0-7803-3851-0
Type
conf
DOI
10.1109/CEIDP.1997.634612
Filename
634612
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