DocumentCode :
2081387
Title :
Diffusion Distance for Histogram Comparison
Author :
Ling, Haibin ; Okada, Kazunori
Author_Institution :
University of Maryland
Volume :
1
fYear :
2006
fDate :
17-22 June 2006
Firstpage :
246
Lastpage :
253
Abstract :
In this paper we propose diffusion distance, a new dissimilarity measure between histogram-based descriptors. We define the difference between two histograms to be a temperature field. We then study the relationship between histogram similarity and a diffusion process, showing how diffusion handles deformation as well as quantization effects. As a result, the diffusion distance is derived as the sum of dissimilarities over scales. Being a cross-bin histogram distance, the diffusion distance is robust to deformation, lighting change and noise in histogram-based local descriptors. In addition, it enjoys linear computational complexity which significantly improves previously proposed cross-bin distances with quadratic complexity or higher. We tested the proposed approach on both shape recognition and interest point matching tasks using several multi-dimensional histogram-based descriptors including shape context, SIFT, and spin images. In all experiments, the diffusion distance performs excellently in both accuracy and efficiency in comparison with other state-of-the-art distance measures. In particular, it performs as accurately as the Earth Mover’s Distance with much greater efficiency.
Keywords :
Computational complexity; Diffusion processes; Histograms; Image recognition; Multi-stage noise shaping; Noise robustness; Quantization; Shape; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2006 IEEE Computer Society Conference on
ISSN :
1063-6919
Print_ISBN :
0-7695-2597-0
Type :
conf
DOI :
10.1109/CVPR.2006.99
Filename :
1640766
Link To Document :
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