DocumentCode :
2081788
Title :
Integrating hierarchical test benches into an evolving VHDL design environment
Author :
Sullivan, Michael F. ; Bondi, James O. ; Kopca, David J. ; Patel, Nayan D.
Author_Institution :
Dept. of Microelecton., Texas Instrum. Inc., Dallas, TX, USA
fYear :
1994
fDate :
1-4 May 1994
Firstpage :
76
Lastpage :
78
Abstract :
Flexible, hierarchical test benches are developed naturally as part of the normal model development process and support VHDL, WAVES, and company-proprietary standards. The integration of these tool-automated VHDL test benches is described. In TI-Microelectronics, automated development of VHDL test benches and integration of test bench development into the VHDL modeling process are being employed successfully. The novel hierarchical structuring technique described integrates automated VHDL test bench capabilities with the historical TI proprietary design environment
Keywords :
circuit CAD; integrated circuit testing; specification languages; TI Test Description Language; TI-Microelectronics; WAVES; evolving VHDL design environment; hierarchical test benches; Automatic testing; Bonding; Electronic equipment testing; Electronic mail; Instruments; Integrated circuit modeling; Integrated circuit testing; Microelectronics; Standards development; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VHDL International Users Forum. Spring Conference, 1994. Proceedings of
Conference_Location :
Oakland, CA
Print_ISBN :
0-8186-6215-8
Type :
conf
DOI :
10.1109/VIUF.1994.323963
Filename :
323963
Link To Document :
بازگشت