• DocumentCode
    2081938
  • Title

    Near-Junction Thermal Management for Wide Bandgap Devices

  • Author

    Bar-Cohen, Avram ; Albrecht, John D. ; Maurer, Joseph J.

  • Author_Institution
    Defense Adv. Res. Projects Agency, Arlington, VA, USA
  • fYear
    2011
  • fDate
    16-19 Oct. 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Near-junction thermal management is critical to achieving the promise of electronic and photonic devices using wide bandgap materials. In such devices, including GaN HEMTs in PAs, the thermal resistance associated with the "near-junction" region dominates the heat removal path and is often as large as the thermal resistance of all the other elements in the resistance chain. As part of DARPA\´s portfolio in Thermal Management Technologies (TMT), efforts are underway to develop transformative, paradigm-changing cooling techniques. This paper will briefly review the thermal management needs of WBG devices and DARPA\´s Thermal Management Technologies portfolio, with emphasis on the goals and status of these efforts relative to the current State-of-the-Art. Attention will then turn to promising options in near-junction cooling and the challenges inherent in realizing their potential for WBG device thermal management.
  • Keywords
    III-V semiconductors; gallium compounds; high electron mobility transistors; power amplifiers; thermal management (packaging); thermal resistance; wide band gap semiconductors; DARPA TMT porfolio; DARPA thermal management technology portfolio; GaN; HEMT; TMT; WBG device thermal management; electronic devices; high electron mobility transistors; near-junction region; near-junction thermal management technology; paradigm-changing cooling techniques; photonic devices; power amplifiers; thermal resistance; wide bandgap devices; Conductivity; Diamond-like carbon; Gallium nitride; Substrates; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium (CSICS), 2011 IEEE
  • Conference_Location
    Waikoloa, HI
  • ISSN
    1550-8781
  • Print_ISBN
    978-1-61284-711-5
  • Electronic_ISBN
    1550-8781
  • Type

    conf

  • DOI
    10.1109/CSICS.2011.6062454
  • Filename
    6062454