Title :
An automatic test bench generation system
Author :
Kapoor, Shekhar ; Armstrong, James R. ; Rao, Sanat R.
Author_Institution :
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
Presents an automatic test bench generation system for VHDL behavioral models. The Modeler´s Assistant, an interactive CAD tool developed at Virginia Tech, gives the graphical representation of a VHDL behavioral model, called a process model graph (PMG). The process test generator (PTG) is used to generate the stimulus/response test sets for individual processes of a PMG. The hierarchical behavioral test generator (HBTG) accepts the PMG and the test sets produced by PTG as inputs, and then hierarchically constructs a test sequence for the entire model. The test sequence is converted into a test bench by the test bench generator (TBG), and it is then used for simulation of the model. Experimental results show that the test benches generated exercise the models thoroughly
Keywords :
automatic testing; integrated circuit testing; logic CAD; logic testing; specification languages; Modeler´s Assistant; VHDL behavioral models; automatic test bench generation system; graphical representation; hierarchical behavioral test generator; hierarchical test sequence construction; interactive CAD tool; process model graph; process test generator; simulation; stimulus/response test sets; test bench generator; Automatic testing; Circuit simulation; Circuit testing; Digital circuits; Electronics industry; Flow graphs; Hardware design languages; Integrated circuit interconnections; Process design; System testing;
Conference_Titel :
VHDL International Users Forum. Spring Conference, 1994. Proceedings of
Conference_Location :
Oakland, CA
Print_ISBN :
0-8186-6215-8
DOI :
10.1109/VIUF.1994.323970