DocumentCode :
2082036
Title :
A 40-Gb/s quarter rate CDR with 1∶4 demultiplexer in 90-nm CMOS technology
Author :
Yan, Shuangchao ; Chen, Yingmei ; Wang, Tao ; Wang, Hui
Author_Institution :
Inst. of RF- & OE-ICs, Southeast Univ., Nanjing, China
fYear :
2010
fDate :
11-14 Nov. 2010
Firstpage :
673
Lastpage :
676
Abstract :
This paper presents a 40-Gb/s phase-locked clock and data recovery (CDR) circuit with 1:4 demultiplexer in IBM 90-nm CMOS technology. The CDR circuit incorporates an inductorless eight-phase LC voltage-controlled oscillator (VCO) and a quarter-rate bang-bang phase detector (PD). A novel inductorless eight-phase LC VCO including four LC oscillator cells is presented to generate the eight-phase outputs. A one-forth-rate phase detector employing eight flip-flops is proposed. The 40-Gb/s input data are sampled with eight parallel different-ial master-salve flip-flops every 12.5 ps and the 40-Gb/s data are demultiplexed into four 10-Gb/s outputs when the CDR circuit is locked. The recovered clock exhibits 200mV output swing and a jitter of 0.2 psrms and 0.6 pspp. The retimed data exhibits 200mV output swing and a jitter of 0.5 psrms and 2.1 pspp. The CDR circuit consumes 72 mW from a 1.2 V supply excluding out buffers.
Keywords :
CMOS integrated circuits; clock and data recovery circuits; demultiplexing equipment; flip-flops; jitter; phase detectors; voltage-controlled oscillators; IBM CMOS technology; LC voltage-controlled oscillator; bit rate 40 Gbit/s; clock and data recovery circuit; demultiplexer; flip-flops; jitter; phase locked circuit; power 72 mW; quarter rate CDR; quarter-rate bang-bang phase detector; size 90 nm; voltage 1.2 V; CMOS integrated circuits; CMOS technology; Clocks; Logic gates; Optical buffering; Oscillators; Voltage control; CDR; bang-bang phase detector (PD); currentmode logic (CML); demultiplexers; multiphase voltage-controlled oscillator (VCO); phase-locked loops (PLL);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communication Technology (ICCT), 2010 12th IEEE International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-6868-3
Type :
conf
DOI :
10.1109/ICCT.2010.5688510
Filename :
5688510
Link To Document :
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