• DocumentCode
    2082167
  • Title

    Two-beam second-harmonic generation for precise and self consistent characterization of thin films

  • Author

    Cattaneo, Stefano ; Kauranen, Martti

  • Author_Institution
    Inst. of Phys., Tampere Univ. of Technol.
  • fYear
    2004
  • fDate
    21-21 May 2004
  • Firstpage
    272
  • Lastpage
    273
  • Abstract
    Second-harmonic generation using two fundamental beams, instead of one, offers significant advantages for characterizing nonlinear optical thin films. The new technique is more precise and allows verification of the internal consistency of the results
  • Keywords
    optical films; optical harmonic generation; optical testing; thin films; nonlinear optical films; precise characterization; second-harmonic generation; self-consistent characterization; thin films; two fundamental beams;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics Conference, 2004. (IQEC). International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    1-55752-778-4
  • Type

    conf

  • Filename
    1366746
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2082167