Title :
Two-beam second-harmonic generation for precise and self consistent characterization of thin films
Author :
Cattaneo, Stefano ; Kauranen, Martti
Author_Institution :
Inst. of Phys., Tampere Univ. of Technol.
Abstract :
Second-harmonic generation using two fundamental beams, instead of one, offers significant advantages for characterizing nonlinear optical thin films. The new technique is more precise and allows verification of the internal consistency of the results
Keywords :
optical films; optical harmonic generation; optical testing; thin films; nonlinear optical films; precise characterization; second-harmonic generation; self-consistent characterization; thin films; two fundamental beams;
Conference_Titel :
Quantum Electronics Conference, 2004. (IQEC). International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-55752-778-4
