DocumentCode :
2082171
Title :
A 2.5-dB Insertion Loss, DC-60 GHz CMOS SPDT Switch in 45-nm SOI
Author :
Parlak, Mehmet ; Buckwalter, James F.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, La Jolla, CA, USA
fYear :
2011
fDate :
16-19 Oct. 2011
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents a single-pole double-throw (SPDT), transmit/receive (T/R) switch operating from DC to 60 GHz. The SPDT switch is based on a series-shunt circuit with broadband input and output matching circuits and is implemented in a partially-depleted, 45-nm silicon-on-insulator (SOI) process. A buried oxide (BOX) layer is demonstrated to minimize substrate coupling. The switch exhibits a measured insertion loss of less than 1.7 dB at 45 GHz and less than 2.5 dB at 60 GHz with an isolation of greater than 25 dB at 45 GHz. To our knowledge, this is the lowest insertion loss demonstrated for an SPDT switch at 60 GHz in a CMOS process. With a control voltage of 1.2 V, the measured P1dB and IIP3 are 7.1 dBm and 18.2 dBm, respectively. The active chip area is 0.18×0.22 mm2.
Keywords :
CMOS integrated circuits; field effect MIMIC; microwave switches; silicon-on-insulator; CMOS SPDT switch; buried oxide layer; frequency 60 GHz; loss 2.5 dB; series-shunt circuit; silicon-on-insulator; single-pole double-throw switch; size 45 nm; substrate coupling; transmit-receive switch; voltage 1.2 V; CMOS integrated circuits; CMOS technology; Insertion loss; Loss measurement; Substrates; Switches; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium (CSICS), 2011 IEEE
Conference_Location :
Waikoloa, HI
ISSN :
1550-8781
Print_ISBN :
978-1-61284-711-5
Electronic_ISBN :
1550-8781
Type :
conf
DOI :
10.1109/CSICS.2011.6062463
Filename :
6062463
Link To Document :
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