Title :
3D face recognition: A robust multi-matcher approach to data degradations
Author :
Ben Soltana, Wael ; Ardabilian, Mohsen ; Lemaire, Pierre ; Huang, Di ; Szeptycki, Przemyslaw ; Chen, Liming ; Erdogmus, Nesli ; Daniel, Lionel ; Dugelay, Jean-Luc ; Ben Amor, Boulbaba ; Drira, Hassen ; Daoudi, Mohamed ; Colineau, Joseph
Author_Institution :
LIRIS, Ecole Centrale de Lyon, Lyon, France
fDate :
March 29 2012-April 1 2012
Abstract :
Over the past decades, 3D face has emerged as a solution to face recognition due to its reputed invariance to lighting conditions and pose. While proposed approaches have proven their efficiency over renowned databases as FRGC, less effort was spent on studying the robustness of algorithms to quality degradations. In this paper, we present a study of the robustness of four state of the art algorithms and a multi-matcher framework to face model degradations such as Gaussian noise, decimation, and holes. The four state of the art algorithms were chosen for their different and complementary properties and exemplify the major classes of 3D face recognition solutions. As they displayed different behavior under data degradations, we further designed a fusion framework to best take into account their complementary properties. The proposed multi-matcher scheme is based on an offline and an online weight learning process. Experiments were conducted on a subset of the FRGC database, on which we generated degradations. Results demonstrate the competitive robustness of the proposed approach.
Keywords :
Gaussian processes; art; face recognition; image fusion; image matching; visual databases; 3D face recognition solution; FRGC database subset; Gaussian noise; art algorithms; competitive robustness; complementary properties; data degradation; decimation; face model degradations; fusion framework; holes; lighting conditions; offline weight learning process; online weight learning process; robust multimatcher approach; Degradation; Face; Face recognition; Probes; Shape; Solid modeling; Three dimensional displays;
Conference_Titel :
Biometrics (ICB), 2012 5th IAPR International Conference on
Conference_Location :
New Delhi
Print_ISBN :
978-1-4673-0396-5
Electronic_ISBN :
978-1-4673-0397-2
DOI :
10.1109/ICB.2012.6199766