DocumentCode :
2082406
Title :
A high-linearity, LC-Tuned, 24-GHz T/R switch in 90-nm CMOS
Author :
Park, Piljae ; Shin, Dong Hun ; Pekarik, John J. ; Rodwell, Mark ; Yue, C. Patrick
Author_Institution :
High-Speed Silicon Lab., Univ. of California, Santa Barbara, CA
fYear :
2008
fDate :
June 17 2008-April 17 2008
Firstpage :
369
Lastpage :
372
Abstract :
This paper presents an LC-tuned, 24-GHz single-pole double-throw (SPDT) transmit/receive (T/R) switch implemented in 90-nm CMOS. The design focuses on the techniques to increase the power handling capability in the transmit (Tx) mode under 1.2-V operation. The switch achieves a measured P-1dB of 28.7 dBm, which represents the highest linearity, reported to date, for CMOS millimeter-wave T/R switches. The transmit and receive (Rx) branches employ different switch topologies to minimize the power leakage into the Rx path during Tx mode, and hence improve the linearity. To accommodate large signal swing, AC floating bias is applied using large bias resistors to all terminals of the switch devices. Triple-well devices are utilized to effectively float the substrate terminals. The switch uses a single 1.2-V digital control signal for T/R mode selection and for source/drain bias. The measured insertion loss is 3.5 dB and return loss is better than -10 dB at 24 GHz.
Keywords :
CMOS integrated circuits; RLC circuits; circuit tuning; microwave switches; millimetre wave circuits; AC floating bias; CMOS; frequency 24 GHz; insertion loss; power leakage; return loss; single-pole double-throw transmit-receive switch; substrate terminals; voltage 1.2 V; Digital control; Insertion loss; Linearity; Millimeter wave measurements; Millimeter wave technology; Resistors; Roentgenium; Switches; Topology; Virtual colonoscopy; 1-dB compression point; CMOS transmit/receive (T/R) switch; floating substrate; triple-well;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits Symposium, 2008. RFIC 2008. IEEE
Conference_Location :
Atlanta, GA
ISSN :
1529-2517
Print_ISBN :
978-1-4244-1808-4
Electronic_ISBN :
1529-2517
Type :
conf
DOI :
10.1109/RFIC.2008.4561456
Filename :
4561456
Link To Document :
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