• DocumentCode
    2082747
  • Title

    Decoding stimuli from multi-source neural responses

  • Author

    Lin Li ; Choi, Jin Soo ; Francis, Joseph T. ; Sanchez, J.C. ; Principe, Jose C.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Florida, Gainesville, FL, USA
  • fYear
    2012
  • fDate
    Aug. 28 2012-Sept. 1 2012
  • Firstpage
    1331
  • Lastpage
    1334
  • Abstract
    Spike trains and local field potentials (LFPs) are two different manifestations of neural activity recorded simultaneously from the same electrode array and contain complementary information of stimuli or behaviors. This paper proposes a tensor product kernel based decoder, which allows modeling the sample from different sources individually and mapping them onto the same reproducing kernel Hilbert space (RKHS) defined by the tensor product of the individual kernels for each source, where linear regression is conducted to identify the nonlinear mapping from the multi-type neural responses to the stimuli. The decoding results of the rat sensory stimulation experiment show that the tensor-product-kernel-based decoder outperforms the decoders with either single-type neural activities.
  • Keywords
    Hilbert spaces; bioelectric potentials; biomedical electrodes; medical signal processing; neurophysiology; kernel Hilbert space; linear regression; multi-type neural response; multisource neural response; nonlinear mapping; rat sensory stimulation; single-type neural activity; tensor product kernel based decoder; tensor-product-kernel-based decoder; Correlation; Decoding; Kernel; Smoothing methods; Stochastic processes; Tensile stress; Timing; Action Potentials; Algorithms; Animals; Electrodes, Implanted; Female; Linear Models; Models, Neurological; Rats; Rats, Long-Evans; Sensory Receptor Cells; Signal Processing, Computer-Assisted; Somatosensory Cortex; Touch;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4119-8
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2012.6346183
  • Filename
    6346183