• DocumentCode
    2082834
  • Title

    Handbook-based high unit-value software reliability prediction method

  • Author

    Jackson, Alazel

  • Author_Institution
    Eng., Technol. & Field Oper., Raytheon Tech. Services Co., El Segundo, CA, USA
  • fYear
    2010
  • fDate
    25-28 Jan. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Modern electronic systems typically contain significant amounts of software. Therefore, for a system reliability prediction to be accurate, it must include software reliability predictions. Many of the commonly used software reliability prediction methods are based on estimation models that require empirical test data. Typically, however, this kind of data is not readily available when a software reliability prediction is needed. For this reason, handbook-based methods, such as the Software Capability Maturity Model (CMM®) developed by the Software Engineering Institute (SEI), are commonly used throughout industry. This paper discusses an enhancement to traditional handbook-based software reliability prediction method that facilitates obtaining repeatable results as well as overcoming limitations in modeling initial reliability of the software. This enhancement results in a handbook-based software reliability prediction method that is appropriate for use on high unit-value software components.
  • Keywords
    software reliability; Software Engineering Institute; handbook-based methods; software capability maturity model; software reliability prediction; Capability maturity model; Curve fitting; Hardware; Prediction methods; Predictive models; Product safety; Software quality; Software reliability; Software safety; Software testing; Curve fitting; Handbook-based; High Unit-Value; Software Quality; Software Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
  • Conference_Location
    San Jose, CA
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-5102-9
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2010.5447965
  • Filename
    5447965