DocumentCode :
2082989
Title :
Probability of failure of safety-critical systems subject to partial tests
Author :
Brissaud, Florent ; Barros, Anne ; Bérenguer, Christophe
Author_Institution :
Inst. Nat. de l´´Environnement Industriel et des Risques, Parc Technol. ALATA, Verneuil-en-Halatte, France
fYear :
2010
fDate :
25-28 Jan. 2010
Firstpage :
1
Lastpage :
6
Abstract :
A set of general formulas is proposed for the probability of failure on demand (PFD) assessment of MooN architecture (i.e. k-out-of-n) systems subject to proof tests. The proof tests can be partial or full. The partial tests (e.g. visual inspections, partial stroke testing) are able to detect only some system failures and leave the others latent, whereas the full tests refer to overhauls which restore the system to an as good as new condition. Partial tests may occur at different time instants (periodic or not), up to the full test. The system performances which are investigated are the system availability according to time, the PFD average in each partial test time interval, and the total PFD average calculated on the full test time interval. Following the given expressions, parameter estimations are proposed to assess the system failure rates and the partial test effectiveness according to feedback data from previous test policies. Subsequently, an optimization of the partial test strategy is presented. In the 2oo6 system given as example, an improvement of about 10% of the total PFD average has been obtained, just by a better (non-periodic) distribution of the same number of partial tests, in the full test time interval.
Keywords :
failure analysis; inspection; instruments; parameter estimation; probability; risk management; safety systems; testing; MooN architecture; failure probability; industrial risk management; parameter estimations; partial stroke testing; probability of failure on demand; safety instrumented systems; safety-critical systems failure; system availability; visual inspections; Electronic equipment testing; IEC standards; Industrial electronics; Inspection; Instruments; Phase frequency detector; Preventive maintenance; Safety devices; System testing; Valves; full tests; partial tests; probability of failure on demand; proof tests; safety instrumented systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
Conference_Location :
San Jose, CA
ISSN :
0149-144X
Print_ISBN :
978-1-4244-5102-9
Electronic_ISBN :
0149-144X
Type :
conf
DOI :
10.1109/RAMS.2010.5447972
Filename :
5447972
Link To Document :
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