Title :
Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems
Author :
Cochran, Donna J. ; Boutte, Alvin J. ; Campola, Michael J. ; Carts, Martin A. ; Casey, Megan C. ; Chen, Dakai ; LaBel, Kenneth A. ; Ladbury, Raymond L. ; Lauenstein, Jean-Marie ; Marshall, Cheryl J. ; O´Bryan, Martha V. ; Oldham, Timothy R. ; Pellish, Jon
Author_Institution :
MEI Technol., Inc., Seabrook, MD, USA
Abstract :
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.
Keywords :
avionics; optoelectronic devices; space vehicles; NASA space system; candidate spacecraft electronics; displacement damage compendium; hybrid device; linear bipolar device; optoelectronics; total ionizing dose; Breakdown voltage; Green products; Laboratories; NASA; Protons; Threshold voltage; USA Councils;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2011 IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4577-1281-4
DOI :
10.1109/REDW.2010.6062498
