• DocumentCode
    2083016
  • Title

    Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems

  • Author

    Cochran, Donna J. ; Boutte, Alvin J. ; Campola, Michael J. ; Carts, Martin A. ; Casey, Megan C. ; Chen, Dakai ; LaBel, Kenneth A. ; Ladbury, Raymond L. ; Lauenstein, Jean-Marie ; Marshall, Cheryl J. ; O´Bryan, Martha V. ; Oldham, Timothy R. ; Pellish, Jon

  • Author_Institution
    MEI Technol., Inc., Seabrook, MD, USA
  • fYear
    2011
  • fDate
    25-29 July 2011
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.
  • Keywords
    avionics; optoelectronic devices; space vehicles; NASA space system; candidate spacecraft electronics; displacement damage compendium; hybrid device; linear bipolar device; optoelectronics; total ionizing dose; Breakdown voltage; Green products; Laboratories; NASA; Protons; Threshold voltage; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2011 IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4577-1281-4
  • Type

    conf

  • DOI
    10.1109/REDW.2010.6062498
  • Filename
    6062498
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2083016