DocumentCode
2083101
Title
Dependability evaluation of complex embedded systems and microsystems
Author
Malassé, Olaf ; Buchheit, Grégory ; Pock, Michael ; Walter, Max
Author_Institution
A3SI, Arts et Metiers ParisTech, France
fYear
2010
fDate
25-28 Jan. 2010
Firstpage
1
Lastpage
6
Abstract
The evaluation of the dependability performance (RAMS) of complex embedded systems requires the development of new approaches. In software-intensive systems, the dependability structure of the functions depends on the software. The search of fault sequences must involve software and hardware. The proposed method contributes to the qualitative and quantitative safety analysis of systems and micro-systems.
Keywords
embedded systems; micromechanical devices; performance evaluation; safety-critical software; RAMS; complex embedded systems; dependability evaluation; fault sequences; microsystems; safety analysis; software intensive systems; Art; Automata; Availability; Control systems; Embedded system; Hardware; Maintenance; Performance analysis; Process design; Safety; Binary Decision Diagram; Finite State Automaton; RAMS analysis; SW/HW analysis; complex systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
Conference_Location
San Jose, CA
ISSN
0149-144X
Print_ISBN
978-1-4244-5102-9
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2010.5447976
Filename
5447976
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