DocumentCode :
2083142
Title :
Life and reliability forecasting of the CSADT using Support Vector Machines
Author :
Li, Shuzhen ; Li, Xiaoyang ; Jiang, Tongmin
Author_Institution :
Dept. of Syst. Eng., Beihang Univ., Beijing, China
fYear :
2010
fDate :
25-28 Jan. 2010
Firstpage :
1
Lastpage :
6
Abstract :
Accelerated Degradation Testing (ADT) is now adopted frequently to verify the reliability and life of high-reliable, long-life product. But ADT data analysis methods are still deficiency. Due to the excellent capable of little sample learning and nonlinear mapping, SVM prediction model is widely used in many fields. In this paper, a new degradation prediction method based on Support Vector Machines (SVM) is proposed and developed to predict time-to-failure of product. This prediction method is also compared with BPANN and regression methods to validate its effectiveness. Moreover, Constant Stress ADT is studied and ADT data are divided into several sets of performance degradation under different stress levels. Using SVM prediction method, all degradation processes are predicted to failure and lifetimes are obtained easily, then life and reliability under normal condition are evaluated by accelerated model. Simulation case demonstrates that the life and reliability prediction for CSADT based on SVM is reasonable and validity.
Keywords :
backpropagation; failure analysis; life testing; neural nets; production engineering computing; regression analysis; reliability; remaining life assessment; support vector machines; BPANN; CSADT; SVM prediction model; accelerated degradation testing; backpropagation artificial neural network; constant stress ADT data analysis methods; failure prediction; nonlinear mapping; product life prediction; regression methods; reliability forecasting; support vector machines; Acceleration; Artificial neural networks; Data engineering; Degradation; Life estimation; Life testing; Predictive models; Stress; Support vector machine classification; Support vector machines; Accelerated degradation testing; SVM; life prediction; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
Conference_Location :
San Jose, CA
ISSN :
0149-144X
Print_ISBN :
978-1-4244-5102-9
Electronic_ISBN :
0149-144X
Type :
conf
DOI :
10.1109/RAMS.2010.5447978
Filename :
5447978
Link To Document :
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