Title :
Total Dose Test Results for CubeSat Electronics
Author :
Avery, Keith ; Finchel, Jeffery ; Mee, Jesse ; Kemp, William ; Netzer, Richard ; Elkins, Donald ; Zufelt, Brian ; Alexander, David
Author_Institution :
Air Force Res. Lab., Kirtland AFB, NM, USA
Abstract :
CubeSats are increasingly important for space research. Their low orbits and short mission durations permit using electronics with modest radiation failure thresholds. Total ionizing dose irradiation results are presented for microelectronics interesting for CubeSat applications.
Keywords :
MOSFET; integrated circuit testing; microcontrollers; multiplying circuits; radiation effects; space vehicle electronics; CubeSat electronics; microelectronics; radiation failure thresholds; short mission durations; space research; total dose test; total ionizing dose irradiation; Annealing; EPROM; Electronics packaging; Microcontrollers; Multiplexing; Performance evaluation; Radiation effects;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2011 IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4577-1281-4
DOI :
10.1109/REDW.2010.6062504
