Title :
Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab
Author :
Hafer, Craig ; Lahey, Mike ; Harris, Debra ; Larsen, Jennifer ; Sievert, Fred ; Sims, Tony ; Meyer, Steve ; Dumitru, Radu ; Jordan, Anthony ; Milliken, Peter
Author_Institution :
Aeroflex Colorado Springs, Colorado Springs, CO, USA
Abstract :
Aeroflex mitigates the concern of IC part obsolescence by migrating RadHard devices to alternate wafer fabs as fabs become shuttered or unavailable. Comparison radiation performance data are presented for recently migrated devices.
Keywords :
CMOS digital integrated circuits; radiation effects; CMOS technology; RadHard devices; aeroflex; alternate wafer fab; heavy ion single event effects performance; wafer fabs; Application specific integrated circuits; Arrays; Logic gates; Performance evaluation; Power supplies; Springs; Tin;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2011 IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4577-1281-4
DOI :
10.1109/REDW.2010.6062506
