DocumentCode
2083174
Title
Case study: an NTSC imaging system timing gate array design
Author
Vincent, John A.
Author_Institution
Kodak Res. Lab., Rochester, NY, USA
fYear
1989
fDate
25-28 Sep 1989
Lastpage
37987
Abstract
A case study of the design of a timing generator ASIC (application-specific integrated circuit) for an NTSC-compatible imaging system is presented. The case history includes many of the classic problems in this type of design. Consideration is given to the problems of changing specifications during the design process, adding special functionality while minimizing testability enhancements, the pressure of timeliness, and the importance of thoroughly verifying every part of the design
Keywords
application specific integrated circuits; computerised picture processing; logic arrays; NTSC-compatible imaging system; functionality; specifications; testability; timing gate array; timing generator ASIC; Application specific integrated circuits; Computer aided software engineering; Control systems; History; Laboratories; Logic; Process design; Telephony; Testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Seminar and Exhibit, 1989. Proceedings., Second Annual IEEE
Conference_Location
Rochester, NY
Type
conf
DOI
10.1109/ASIC.1989.123214
Filename
123214
Link To Document