Title :
Case study: an NTSC imaging system timing gate array design
Author :
Vincent, John A.
Author_Institution :
Kodak Res. Lab., Rochester, NY, USA
Abstract :
A case study of the design of a timing generator ASIC (application-specific integrated circuit) for an NTSC-compatible imaging system is presented. The case history includes many of the classic problems in this type of design. Consideration is given to the problems of changing specifications during the design process, adding special functionality while minimizing testability enhancements, the pressure of timeliness, and the importance of thoroughly verifying every part of the design
Keywords :
application specific integrated circuits; computerised picture processing; logic arrays; NTSC-compatible imaging system; functionality; specifications; testability; timing gate array; timing generator ASIC; Application specific integrated circuits; Computer aided software engineering; Control systems; History; Laboratories; Logic; Process design; Telephony; Testing; Timing;
Conference_Titel :
ASIC Seminar and Exhibit, 1989. Proceedings., Second Annual IEEE
Conference_Location :
Rochester, NY
DOI :
10.1109/ASIC.1989.123214
