Title :
SEE and TID Results for Commercial Non-Optogalvanic Isolators for Space Application
Author :
Jacobson, Mark A. ; Buchner, Stephen P. ; Hughes, Harold L. ; McMarr, Patrick J.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
Three commercially available digital galvanic isolation devices were evaluated for use on a low-earth orbit space mission with a seven year operational life. They were pre-screened for destructive single event effects before being tested for their total ionizing dose (TID) sensitivity.
Keywords :
ion beam effects; space vehicle electronics; destructive single event effects; digital galvanic isolation devices; low-earth orbit space mission; nonoptogalvanic isolators; seven year operational life; space application; time 7 yr; total ionizing dose sensitivity; Ions; Isolators; Laboratories; Lasers; Measurement by laser beam; Receivers;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2011 IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4577-1281-4
DOI :
10.1109/REDW.2010.6062508
