• DocumentCode
    2083205
  • Title

    A RF CMOS amplifier with optimized gain, noise, linearity and return losses for UWB applications

  • Author

    Nguyen, Giang D. ; Cimino, Kurt ; Feng, Milton

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois, Univ., Urbana, IL
  • fYear
    2008
  • fDate
    June 17 2008-April 17 2008
  • Firstpage
    505
  • Lastpage
    508
  • Abstract
    Trade-off between noise figure (NF) and input return loss (RL or |S11|) imposes a fundamental limitation on the design of low noise amplifiers (LNA) for ultra-wideband (UWB) applications. A graph-based approach using Smith Chart to achieve optimum values for both NF and input RL over the desired LNA bandwidth is presented. The proposed method and device optimization technique are systematically incorporated to enhance the overall LNA performance in terms of gain, noise, linearity, and power consumption. An UWB LNA prototype is implemented in a 0.13 mum CMOS process to demonstrate the use of this methodology. It shows a gain of 11.3 dB, a NF of 3.9-4.6 dB, and an IIP3 of 3.2-5 dBm over a -3 dB bandwidth of 2.2-9 GHz while consuming 30 mW from a 1.2 V DC supply.
  • Keywords
    CMOS integrated circuits; low noise amplifiers; radiofrequency amplifiers; radiofrequency integrated circuits; ultra wideband technology; RF CMOS amplifier; Smith Chart; UWB LNA; bandwidth 2.2 GHz to 9 GHz; gain 11.3 dB; input return loss; low noise amplifiers; noise figure; noise figure 3.9 dB to 4.6 dB; power 30 mW; size 0.13 micron; voltage 1.2 V; Bandwidth; Linearity; Low-noise amplifiers; Noise figure; Noise measurement; Optimization methods; Performance gain; Radio frequency; Radiofrequency amplifiers; Ultra wideband technology; CMOS; Smith chart; low noise amplifier (LNA); noise matching; ultrawideband (UWB);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium, 2008. RFIC 2008. IEEE
  • Conference_Location
    Atlanta, GA
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-1808-4
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2008.4561487
  • Filename
    4561487