• DocumentCode
    2083285
  • Title

    Soft computing approaches in reliability modeling and analysis of repairable systems

  • Author

    Salgado, Marcia F P ; Caminhas, Walmir M. ; Menezes, Benjamim R.

  • Author_Institution
    Electr. Eng. - Comput. Intell. Res. Group, Fed. Univ. of Minas Gerais, Belo Horizonte, Brazil
  • fYear
    2010
  • fDate
    25-28 Jan. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper reviews soft computing approaches for reliability modeling and analysis of repairable systems. Although soft computing techniques such as neural networks and fuzzy systems and even stochastic methods have been employed for solving many different engineering complex problems, when it comes to reliability area traditional approaches are still preferred by industry. Unfortunately with the increasing complexity of systems such techniques might not be able to capture the changes in system features in a precise way what could help to prevent failures and improve system performance. This is a fairly new research area and the literature available points to the new challenges reliability engineers will have to face and the new tools they might use for planning and improving system reliability. In this paper basics of soft computing techniques will be provided as well as examples on how to apply them on the modeling and analysis of repairable systems. It is emphasized that this is a broad open subject and this paper does not try to be conclusive by any means.
  • Keywords
    software reliability; fuzzy systems; neural networks; reliability modeling; repairable system analysis; soft computing approach; stochastic methods; Artificial neural networks; Computational intelligence; Computer applications; Computer networks; Context modeling; Failure analysis; Fuzzy systems; Maintenance engineering; Power engineering computing; Reliability engineering; computational intelligence; maintainability; reliability; repairable systems; soft computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
  • Conference_Location
    San Jose, CA
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-5102-9
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2010.5447986
  • Filename
    5447986