DocumentCode :
2083368
Title :
LPCVD SiGe for heterojunction bipolar transistors
Author :
Parker, G.J. ; Ashburn, P. ; Bonar, J.M ; Gregory, H.J. ; Kennedy, G.P. ; Hamel, J.S.
Author_Institution :
Dept. of Electron. & Comput. Sci., Southampton Univ., UK
fYear :
1995
fDate :
34744
Firstpage :
42401
Lastpage :
42405
Abstract :
In this work SiGe Heterojunction Bipolar Transistors (HBTs) are grown using Low-Pressure Chemical Vapour Deposition (LPCVD). To date LPCVD has tended to produce higher quality material for device applications than Molecular Beam Epitaxy (MBE). However, the quality of MBE grown material continues to improve and in the long-term it will be throughput rather than material quality that will become the issue. The LPCVD technique is easily scalable and able to accommodate batches of wafers, MBE is not so easily scalable. Although both techniques are being researched to much the same extent, it remains to be seen which will become the dominant process when this technology comes to market
Keywords :
Ge-Si alloys; chemical vapour deposition; heterojunction bipolar transistors; semiconductor growth; semiconductor materials; HBTs; LPCVD; SiGe; SiGe heterojunction bipolar transistors; device applications; growth; low-pressure chemical vapour deposition; material quality; scalability; throughput; wafer batches;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Advanced MOS and Bi-Polar Devices, IEE Colloquium on
Conference_Location :
London
Type :
conf
DOI :
10.1049/ic:19950178
Filename :
473099
Link To Document :
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