DocumentCode :
2083397
Title :
Model type identification of four-level quantum systems by projective measurement
Author :
Zhou Weiwei ; Sun Zhi-qiang ; Schirmer, S.G. ; Gong Er-Ling ; Xie Hong-wei ; Zhang Ming
Author_Institution :
Coll. of Mechatron. Eng. & Autom., Nat. Univ. of Defense Technol., Changsha, China
fYear :
2010
fDate :
29-31 July 2010
Firstpage :
5883
Lastpage :
5888
Abstract :
Hamiltonian of finite-dimensional quantum closed systems can be classified by its degeneracy and corresponding parameter models for the systems can be given respectively. Based on this kind of classification, we explore the model type identification problem for four-level quantum closed systems when projective measurement is available. We show that to a certain context the model type identification problem can be reduced to a problem of spectrum analysis. However when only one kind of projective measurement is available, the model type of a four-level quantum closed system can not be completely discriminated just by spectrum analysis for most cases. Furthermore, we give an experimental design to the complete model type identification of a four-level quantum closed system with a special kind of Hamiltonian by spectrum analysis, when more than one kind of projective measurement is available.
Keywords :
eigenvalues and eigenfunctions; quantum theory; finite-dimensional quantum closed system; four-level quantum system; model type identification problem; parameter model; projective measurement; spectrum analysis; Analytical models; Context; Eigenvalues and eigenfunctions; Equations; Mathematical model; Spectral analysis; Tomography; Identification; Model Type; Parameter Model; Projective Measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control Conference (CCC), 2010 29th Chinese
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-6263-6
Type :
conf
Filename :
5572505
Link To Document :
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