DocumentCode
2083397
Title
Model type identification of four-level quantum systems by projective measurement
Author
Zhou Weiwei ; Sun Zhi-qiang ; Schirmer, S.G. ; Gong Er-Ling ; Xie Hong-wei ; Zhang Ming
Author_Institution
Coll. of Mechatron. Eng. & Autom., Nat. Univ. of Defense Technol., Changsha, China
fYear
2010
fDate
29-31 July 2010
Firstpage
5883
Lastpage
5888
Abstract
Hamiltonian of finite-dimensional quantum closed systems can be classified by its degeneracy and corresponding parameter models for the systems can be given respectively. Based on this kind of classification, we explore the model type identification problem for four-level quantum closed systems when projective measurement is available. We show that to a certain context the model type identification problem can be reduced to a problem of spectrum analysis. However when only one kind of projective measurement is available, the model type of a four-level quantum closed system can not be completely discriminated just by spectrum analysis for most cases. Furthermore, we give an experimental design to the complete model type identification of a four-level quantum closed system with a special kind of Hamiltonian by spectrum analysis, when more than one kind of projective measurement is available.
Keywords
eigenvalues and eigenfunctions; quantum theory; finite-dimensional quantum closed system; four-level quantum system; model type identification problem; parameter model; projective measurement; spectrum analysis; Analytical models; Context; Eigenvalues and eigenfunctions; Equations; Mathematical model; Spectral analysis; Tomography; Identification; Model Type; Parameter Model; Projective Measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Control Conference (CCC), 2010 29th Chinese
Conference_Location
Beijing
Print_ISBN
978-1-4244-6263-6
Type
conf
Filename
5572505
Link To Document