Title :
Design methodologies for noise in digital integrated circuits
Author :
Shepard, Kenneth L.
Author_Institution :
Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
Abstract :
In this paper, we describe the growing problems of noise in digital integrated circuits and the design tools and techniques used to ensure the noise immunity of digital designs.
Keywords :
circuit CAD; digital integrated circuits; noise; timing; design methodologies; design tools; digital designs; digital integrated circuits; noise immunity; Circuit noise; Design methodology; Digital integrated circuits; Failure analysis; Integrated circuit interconnections; Integrated circuit noise; Noise level; Permission; Threshold voltage; Timing;
Conference_Titel :
Design Automation Conference, 1998. Proceedings
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-89791-964-5
