• DocumentCode
    2083464
  • Title

    Integration of thin film passive circuits using high/low dielectric constant materials

  • Author

    Chahal, P. ; Haridass, A. ; Pham, A. ; Tummala, R.R. ; Allen, M.G. ; Swaminathan, M. ; Laskar, J.

  • Author_Institution
    Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1997
  • fDate
    18-21 May 1997
  • Firstpage
    739
  • Lastpage
    744
  • Abstract
    Integration of passives is a continuous challenge towards achieving high performance packages with low profile, improved reliability, maximum packaging efficiency and low cost. This paper discusses the design, fabrication and measurement of integrated passive structures using dielectric constants of 3.3 and 9.1, and thickness in the range of 10-21 μm for wireless applications. The use of polymer-ceramic composite material provides the design flexibility to combine both high dielectric constant and low dielectric constant materials within a single module. This allows for the design of matching networks, RF filters and ability to decouple power supplies for mixed signal applications with reduced size
  • Keywords
    composite materials; integrated circuit design; integrated circuit packaging; integrated circuit reliability; microwave integrated circuits; mixed analogue-digital integrated circuits; passive networks; permittivity; printed circuit design; 10 to 21 micron; RF filters; cost; design flexibility; dielectric constant; high performance packages; matching networks; mixed signal applications; packaging efficiency; polymer-ceramic composite material; power supply decoupling; profile; reliability; thin film passive circuits; wireless applications; Composite materials; Costs; Dielectric constant; Dielectric measurements; Dielectric thin films; Fabrication; Integrated circuit reliability; Packaging; Passive circuits; Thin film circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1997. Proceedings., 47th
  • Conference_Location
    San Jose, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3857-X
  • Type

    conf

  • DOI
    10.1109/ECTC.1997.606252
  • Filename
    606252