DocumentCode :
2083468
Title :
Efficient analysis of imperfect coverage systems with functional dependence
Author :
Xing, Liudong ; Morrissette, Brock A. ; Dugan, Joanne Bechta
Author_Institution :
Univ. of Massachusetts - Dartmouth, MA, USA
fYear :
2010
fDate :
25-28 Jan. 2010
Firstpage :
1
Lastpage :
6
Abstract :
Traditional approaches to handling functional dependence in systems with imperfect fault coverage are based on Markov models, which are inefficient due to the well-known state space explosion problem. Also, the Markov-based methods typically assume exponential time-to-failure distributions for the system components. In this paper we propose a new combinatorial approach to handling functional dependence in the reliability analysis of imperfect coverage systems. Based on the total probability theorem and the divide-and-conquer strategy, the approach separates the effects of functional dependence and imperfect fault coverage from the combinatorics of the system solution. The proposed approach is efficient, accurate, and has no limitation on the type of time-to-failure distributions for the system components. The application and advantages of the proposed approach are illustrated through analyses of two examples.
Keywords :
Markov processes; combinatorial mathematics; divide and conquer methods; reliability theory; state-space methods; statistical distributions; Markov model; divide-and-conquer strategy; functional dependence; imperfect coverage systems; reliability analysis; state space explosion problem; time-to-failure distribution; total probability theorem; Aerodynamics; Application software; Combinatorial mathematics; Computer peripherals; Explosions; Failure analysis; Fault trees; Nuclear power generation; Redundancy; State-space methods; combinatorial method; functional dependence; imperfect fault coverage; reliability analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
Conference_Location :
San Jose, CA
ISSN :
0149-144X
Print_ISBN :
978-1-4244-5102-9
Electronic_ISBN :
0149-144X
Type :
conf
DOI :
10.1109/RAMS.2010.5447994
Filename :
5447994
Link To Document :
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