DocumentCode
2083475
Title
An Intelligent Peak Search Program for Digital Electron Diffraction Images of 3D Nano-Crystals
Author
Jiang, Linhua ; Georgieva, Dilyana ; IJspeert, Kim ; Abrahams, Jan Pieter
Author_Institution
Dept. of Biophys. Struct. Chem., Leiden Univ., Leiden, Netherlands
fYear
2009
fDate
17-19 Oct. 2009
Firstpage
1
Lastpage
5
Abstract
Electron diffractograms are lattice images of crystalline samples taken in transmission electron microscopy for molecular structure determination studies. Electron diffraction is a technique widely used in material science and recently it is gaining significance also in life science for studying 2D and 3D organic crystals. However, often the images suffer from strong background noise, masking the data points. Moreover, they suffer also from the strong center beam exposure or a big beam-stop which covers a lot of useful information. This paper presents a user-friendly peak search program in which an autocorrelation algorithm is utilized creatively to intensify the signal and to center the image in the particular regular lattice. An adaptive background removal algorithm is designed to remove the central beam and to reduce the background noise. The latter algorithm can be used for a wide range of applications, such as 2D spectral analysis in physics, NMR Analysis, stars recognition of aerospace photographs.
Keywords
image recognition; molecular electronic states; nanostructured materials; physics computing; spectral analysis; transmission electron microscopy; 2D spectral analysis; 3D nanocrystals; NMR analysis; digital electron diffraction image; electron diffractograms; intelligent peak search program; molecular structure determination; stars recognition; transmission electron microscopy; Algorithm design and analysis; Autocorrelation; Background noise; Crystallization; Diffraction; Lattices; Materials science and technology; Physics; Spectral analysis; Transmission electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
Conference_Location
Tianjin
Print_ISBN
978-1-4244-4129-7
Electronic_ISBN
978-1-4244-4131-0
Type
conf
DOI
10.1109/CISP.2009.5301421
Filename
5301421
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