Title :
Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories
Author :
Oldham, Timothy R. ; Berg, Melanie ; Friendlich, Mark ; Wilcox, Ted ; Seidleck, Christina ; LaBel, Kenneth A. ; Irom, Farokh ; Buchner, Steven P. ; McMorrow, Dale ; Mavis, David G. ; Eaton, Paul H. ; Castillo, James
Abstract :
A series of heavy ion and laser irradiations was performed to investigate previously reported current spikes in flash memories. High current events were observed, however, none matches the previously reported spikes. Plausible mechanisms are discussed.
Keywords :
flash memories; radiation effects; NAND flash memories; heavy ion irradiation; laser irradiation; spike phenomena; Field programmable gate arrays; Ions; Laser beams; Process control; Radiation effects; Testing; Xenon;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2011 IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4577-1281-4
DOI :
10.1109/REDW.2010.6062522
