Title :
Fault analysis of nonlinear circuits from node voltage measurements
Author_Institution :
Dept. of Electr. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
A method is proposed to diagnose and identify faults in active nonlinear resistive circuits. The nonlinear resistances are replaced by the current sources. The nonlinearity of circuits is exploited to identify if the faults occur in nonlinear resistances. When no fault occurs in nonlinear resistances, the parameters of the linear resistances and the dependent sources and the characteristics of the nonlinear resistances may be determined uniquely. When multiple faults occur in nonlinear resistances, they also can be determined uniquely under a certain condition
Keywords :
active networks; fault location; nonlinear network analysis; active nonlinear resistive circuits; current sources; dependent sources; fault analysis; linear resistances; multiple faults; node voltage measurements; Analog circuits; Circuit analysis; Circuit faults; Electrical resistance measurement; Fault diagnosis; Linear circuits; Linearity; Nonlinear circuits; Nonlinear equations; Voltage measurement;
Conference_Titel :
Circuits and Systems, 1988., IEEE International Symposium on
Conference_Location :
Espoo
DOI :
10.1109/ISCAS.1988.15131