Title :
Potential application of FORM and SORM for PRA
Author :
Miller, Ian ; Zampino, Edward ; Pai, Shantaram S. ; Nagpal, Vinod
Author_Institution :
N&R Eng. & Manage. Services, Parma Heights, OH, USA
Abstract :
The focus of this paper is two-fold: 1) a discussion of a process by which a probabilistic risk assessments (PRA) system model is used to direct a multi-disciplinary development project. 2) Under this framework, a potential technique for the application of the First-Order Reliability Method (FORM) and Second-Order Reliability Method (SORM) to provide probabilistic failure data for PRA of structural systems. Technique 2) is an elaboration of the analysis techniques described in chapter 14. Specifically, the technique relies on the concept of the limit state function in conjunction with varying levels of model fidelity, sound engineering judgment, and expert opinion. This methodology is complementary to the Response Surface Method presented and is best utilized during the conceptual or preliminary stages of a design project. This technique is beneficial when reliability data is not readily available and/or one is constrained by aggressive development schedules. As the design matures, the events in the system event tree can be systematically re-defined by a process that uses the results of refined physics-based models.
Keywords :
probability; reliability theory; risk management; expert opinion level; first-order reliability method; model fidelity level; probabilistic failure data; probabilistic risk assessment; response surface method; second-order reliability method; sound engineering judgment level; structural systems; Data engineering; Engineering management; Failure analysis; NASA; Project management; Reliability engineering; Research and development management; Risk management; Safety; Uncertainty; First Order Reliability Method (FORM); Probabilistic Risk Assessment (PRA); Second Order Reliability Method (SORM);
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-5102-9
Electronic_ISBN :
0149-144X
DOI :
10.1109/RAMS.2010.5448004