Title :
The Influence of a Lossy Backmetallization on the Transmission Properties in CPW
Author :
Wu, Ke ; Vahldieck, Ruediger
Author_Institution :
Laboratory for Lightwave Electronics, Microwaves and Communications (LLiMiC), Department of Electrical and Computer Engineering University of Victoria Victoria, B.C., V8W 3P6, Canada
Abstract :
This paper investigates the influence of a lossy backmetallization on the transmission properties in thin- and thick-film coplanar transmission lines. The method of lines has been used together with a selfconsistent approach to include the finite metallization thickness and losses of all conductors on the transmission line. It was found that by using a highly conductive strip within the lossy backmetallization, the overall losses can be reduced.
Keywords :
Conducting materials; Conductivity; Conductors; Coplanar waveguides; Dielectric losses; Dielectric substrates; Frequency; Metallization; Propagation losses; Strips;
Conference_Titel :
Microwave Conference, 1991. 21st European
Conference_Location :
Stuttgart, Germany
DOI :
10.1109/EUMA.1991.336386
