• DocumentCode
    2083819
  • Title

    The Influence of a Lossy Backmetallization on the Transmission Properties in CPW

  • Author

    Wu, Ke ; Vahldieck, Ruediger

  • Author_Institution
    Laboratory for Lightwave Electronics, Microwaves and Communications (LLiMiC), Department of Electrical and Computer Engineering University of Victoria Victoria, B.C., V8W 3P6, Canada
  • Volume
    1
  • fYear
    1991
  • fDate
    9-12 Sept. 1991
  • Firstpage
    716
  • Lastpage
    721
  • Abstract
    This paper investigates the influence of a lossy backmetallization on the transmission properties in thin- and thick-film coplanar transmission lines. The method of lines has been used together with a selfconsistent approach to include the finite metallization thickness and losses of all conductors on the transmission line. It was found that by using a highly conductive strip within the lossy backmetallization, the overall losses can be reduced.
  • Keywords
    Conducting materials; Conductivity; Conductors; Coplanar waveguides; Dielectric losses; Dielectric substrates; Frequency; Metallization; Propagation losses; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1991. 21st European
  • Conference_Location
    Stuttgart, Germany
  • Type

    conf

  • DOI
    10.1109/EUMA.1991.336386
  • Filename
    4136370