DocumentCode :
2083858
Title :
Applications of modeling and simulations with probabilistic method to predict reliability at high confidence level
Author :
Kanapady, Ramdev ; Adib, Ron
Author_Institution :
MSCWorks Inc., Campbell, CA, USA
fYear :
2010
fDate :
25-28 Jan. 2010
Firstpage :
1
Lastpage :
6
Abstract :
In this paper a probabilistic reliability analysis approach at high confidence level is presented that employs the modeling and simulations techniques. This not only reduces the cost of testing, but also predicts the physics-of-failures, response of system and quantifies the uncertainty in loading environment. Probabilistic sensitivities may be determined to assess the relative importance of each of the random variables on the probabilistic response. The effectiveness of the proposed approach is illustrated with a probabilistic wear-out model for dry sliding wear in rubber components using structural reliability methods. A time-dependent structural reliability model is adapted to calculate the probability of wear-out. Degradation of material in time is considered by properly accounting for a degradation model in the limit-state function. Relative impact each underlying variable on life is determined.
Keywords :
modelling; prediction theory; probability; reliability theory; simulation; dry sliding wear; high confidence level; limit state function; modeling techniques; physics-of-failures; probabilistic reliability analysis; probabilistic sensitivities; probabilistic wear-out model; simulations techniques; system response; time dependent structural reliability model; Aerospace materials; Costs; Degradation; Fatigue; Life estimation; Predictive models; Probability; Rubber; System testing; Uncertainty; Modeling; Probabilistic method; Rubber; Simulation; Time-dependent; Wear;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
Conference_Location :
San Jose, CA
ISSN :
0149-144X
Print_ISBN :
978-1-4244-5102-9
Electronic_ISBN :
0149-144X
Type :
conf
DOI :
10.1109/RAMS.2010.5448008
Filename :
5448008
Link To Document :
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