• DocumentCode
    2083858
  • Title

    Applications of modeling and simulations with probabilistic method to predict reliability at high confidence level

  • Author

    Kanapady, Ramdev ; Adib, Ron

  • Author_Institution
    MSCWorks Inc., Campbell, CA, USA
  • fYear
    2010
  • fDate
    25-28 Jan. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper a probabilistic reliability analysis approach at high confidence level is presented that employs the modeling and simulations techniques. This not only reduces the cost of testing, but also predicts the physics-of-failures, response of system and quantifies the uncertainty in loading environment. Probabilistic sensitivities may be determined to assess the relative importance of each of the random variables on the probabilistic response. The effectiveness of the proposed approach is illustrated with a probabilistic wear-out model for dry sliding wear in rubber components using structural reliability methods. A time-dependent structural reliability model is adapted to calculate the probability of wear-out. Degradation of material in time is considered by properly accounting for a degradation model in the limit-state function. Relative impact each underlying variable on life is determined.
  • Keywords
    modelling; prediction theory; probability; reliability theory; simulation; dry sliding wear; high confidence level; limit state function; modeling techniques; physics-of-failures; probabilistic reliability analysis; probabilistic sensitivities; probabilistic wear-out model; simulations techniques; system response; time dependent structural reliability model; Aerospace materials; Costs; Degradation; Fatigue; Life estimation; Predictive models; Probability; Rubber; System testing; Uncertainty; Modeling; Probabilistic method; Rubber; Simulation; Time-dependent; Wear;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
  • Conference_Location
    San Jose, CA
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-5102-9
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2010.5448008
  • Filename
    5448008