Title :
A comparison of methods for supply current analysis
Author :
Frenzel, James F. ; Marinos, Peter N.
Author_Institution :
Idaho Univ., Moscow, ID, USA
Abstract :
It is demonstrated that AC supply current analysis can be an effective method for testing complex digital devices in a technology other than CMOS. Experiments using a microprocessor demonstrate the effectiveness of this approach and its potential for reliability analysis and mixed-signal testing. Results from two different methods of waveform analysis are presented. The application of statistical signal detection methods is shown to provide superior fault detection, compared to AR (autoregressive) modeling. Because the signature is analyzed as a continuous-time signal and no assumptions are made regarding waveform shape or fault effects, it is believed that this method may be applied to the testing of both digital and analog devices, at various levels of integration. An additional benefit may be the capability of detecting minor current aberrations, resulting from activated failure mechanisms prior to functional failure
Keywords :
application specific integrated circuits; circuit reliability; fault location; integrated circuit testing; activated failure mechanisms; continuous-time signal; digital devices; fault detection; minor current aberrations; mixed-signal testing; reliability analysis; statistical signal detection; supply current analysis; waveform analysis; waveform shape; CMOS technology; Current supplies; Failure analysis; Fault detection; Microprocessors; Semiconductor device modeling; Shape; Signal analysis; Signal detection; Testing;
Conference_Titel :
Custom Integrated Circuits Conference, 1991., Proceedings of the IEEE 1991
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0015-7
DOI :
10.1109/CICC.1991.164086
