DocumentCode :
2083901
Title :
Material compatibility and dielectric properties of co-fired high and low dielectric constant ceramic packages
Author :
Natarajan, Raghu ; Dougherty, J.P.
Author_Institution :
Center for Dielectr. Studies, Pennsylvania State Univ., University Park, PA, USA
fYear :
1997
fDate :
18-21 May 1997
Firstpage :
750
Lastpage :
754
Abstract :
Recent trend in integrated ceramics is to have a 3-dimensional integration of passive components onto the low permittivity dielectric substrate to achieve a monolithic multilayer ceramic (MMC) substrate. MMC substrates offer significant gain in both circuit density and device hermiticity leading to increased reliability and low cost packages. Low-temperature glass-ceramic based low K tapes have been demonstrated to have good compatibility with silver metallization and resistor inks. To push the level of passive component integration one step forward, we studied the materials compatibility and co-firing aspects of low K tapes with high dielectric constant Pb-based relaxer materials. Li salt addition to high K ceramic tape was found to be effective in reducing the sintering temperature to match with that of low K tape. It also improved the dielectric properties and, most importantly, gave a wider processing window for the high K material. This paper describes the optimization of the high K tape casting process such as slurry preparation, rheology, solid content, tape release, lamination, and shrinkage matching with the low-K substrate. This paper also demonstrates the successful integration of high and low K materials
Keywords :
casting; ceramics; integrated circuit packaging; integrated circuit reliability; laminates; permittivity; seals (stoppers); sintering; casting process; ceramic packages; circuit density; device hermiticity; dielectric constant; dielectric properties; lamination; low K tapes; low cost packages; low permittivity dielectric substrate; material compatibility; monolithic multilayer ceramic substrate; passive component integration; processing window; reliability; rheology; shrinkage matching; sintering temperature; slurry preparation; solid content; tape release; three-dimensional integration; Ceramics; Costs; Dielectric materials; Dielectric substrates; High K dielectric materials; High-K gate dielectrics; Integrated circuit reliability; Nonhomogeneous media; Packaging; Permittivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1997. Proceedings., 47th
Conference_Location :
San Jose, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-3857-X
Type :
conf
DOI :
10.1109/ECTC.1997.606254
Filename :
606254
Link To Document :
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