Title :
Scalable statistical measurement and estimation of a mmWave CML static divider sensitivity in 65nm SOI CMOS
Author :
Kim, Daeik D. ; Cho, Choongyeun ; Jonghae Kim
Author_Institution :
IBM Semicond. R&D Center, Hopewell Junction, NY
fDate :
June 17 2008-April 17 2008
Abstract :
A CML static divider operates up to 82.4 GHz with 90% yield for 0 dBm input is statistically measured and estimated. The proposed method of statistical measurement enables reliable sensitivity curve estimation by 55% of standard variation, based on the analytic model, simulations, and scalable DC and RF measurements for the first time. A 300 mm full wafer is scanned for the validation.
Keywords :
CMOS logic circuits; current-mode logic; frequency dividers; millimetre wave devices; sensitivity analysis; silicon-on-insulator; statistical analysis; SOI CMOS; mmWave CML static divider sensitivity; sensitivity curve estimation; statistical measurement; CMOS process; CMOS technology; Frequency estimation; Phase locked loops; Radio frequency; Spectral analysis; Testing; Time measurement; Voltage-controlled oscillators; Yield estimation; 65nm SOI CMOS; mmWave CML static divider; process-induced variation; scalable measurement and statistical performance estimation; sensitivity curve;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium, 2008. RFIC 2008. IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1808-4
Electronic_ISBN :
1529-2517
DOI :
10.1109/RFIC.2008.4561515
