Interferometric method for the characterization of optically active metamaterials

The authors recently demonstrated an experimental method for the direct quantification of the dispersion relation of metamaterials. Our setup is based on white-light spectral interferometry and facilitates measurements of complex transmission and reflection coefficients for wavelengths from 650 nm to 1700 nm. The dispersion relation of a metamaterial, thereby, can be readily calculated from the complex coefficients, using the common retrieval algorithm. In this contribution we present a generalization of this interferometric technique aiming at the characterization of optically active metamaterials.