Title :
The influence of instantaneous value and dv/dt of applied voltage upon electrical treeing deterioration
Author :
Osawa, K. ; Urano, K. ; Ehara, Y. ; Kishida, H. ; Ito, T.
Author_Institution :
Dept. of Electr. & Electron. Eng., Musashi Inst. of Technol., Tokyo, Japan
Abstract :
In this study, we performed to analyze the treeing phenomena with a void by discharge magnitude and discharge luminous quantity in each phase angle area. The purpose of this study was to apply this analysis to the diagnosis of degradation by electrical treeing. The discharge magnitude and discharge luminous image were measured by the original measurement system to analyze discharge pulses and discharge luminescence at several phase angle areas of applied voltage. One cycle of applied voltage was divided into twenty areas, which were named φ 1~φ 20 in order from the negative peak point of applied ac voltage. Each phase angle area has informations of applied voltage that are instantaneous value, differential value of applied voltage (dv/dt) and the product of instantaneous value and dv/dt. The results of this analysis indicate that instantaneous value and dv/dt of applied voltage have a close relation with electrical treeing phenomena. Hence, we investigated the influence of instantaneous value and dv/dt of applied voltage upon electrical treeing phenomena
Keywords :
partial discharges; trees (electrical); voids (solid); applied voltage; degradation diagnosis; discharge luminous image; discharge magnitude; discharge pulse; electrical treeing; instantaneous value; phase angle; void; voltage time derivative; Area measurement; Dielectrics and electrical insulation; Luminescence; Needles; Paints; Pulse measurements; Silver; Testing; Trees - insulation; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-3851-0
DOI :
10.1109/CEIDP.1997.634623