DocumentCode :
2084259
Title :
Application of the RIDF´s to the Evaluation of Monopulse Errors Under Saturating ECM Enviroments
Author :
Burgos, M. ; Pèrez, F. ; Izquierdo, J. ; Rodríguez, A.
Volume :
1
fYear :
1991
fDate :
9-12 Sept. 1991
Firstpage :
793
Lastpage :
798
Abstract :
It is usually supposed that monopulse systems are immune to noise- jamming ECM´s because of its internal ellimination of external amplitude and phase modulations. In the paper is proved that this is not true under saturating conditions and an analysis scheme based on the RIDF´s (Random Input Describing Functions) is proposed. The main advantage of this method is its numeric efficiency which allows subsystem´s saturation behaviour be included in dynamic simulators.
Keywords :
Active noise reduction; Electrochemical machining; Gaussian noise; Jamming; Narrowband; Noise level; Phase modulation; Phase noise; Sampling methods; Signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1991. 21st European
Conference_Location :
Stuttgart, Germany
Type :
conf
DOI :
10.1109/EUMA.1991.336399
Filename :
4136383
Link To Document :
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