Development of photonics component failure rate models

This paper summarizes the results of a photonics component and subsystem reliability modeling study that was performed by Quanterion Solutions Incorporated (QSI) under a project sponsored through the Penn State Electro-Optics Center (EOC) by the Naval Air Systems Command under Contract Number N00421-03-D-0044 Delivery Order 08 (approved for public release: control number 09-770). The overall project consisted of four separate tasks. The first task evaluated current methods that potentially could be used to predict the reliability of photonic components. It was concluded that none have the capability to address all of the photonics component types of interest. Some had selected information on relevant technologies, and were used where practical to extract pertinent information towards the goals of this study. The second task defined a model development method that was used to develop the photonics component models. The methodology was similar to that developed for the derivation of the Reliability Information Analysis Center (RIAC) 217Plus models, but was tailored for the unique considerations of this project, along with the specific photonic components concerns. The third task quantified the model parameters by collecting and analyzing reliability data. The goals of the resulting models were to estimate typical failure rates that can be expected for photonics components when used in various military environments. The final task involved the communication of the study results via a Workshop held at the Patuxent Naval Air Station on Sept. 9, 2008. Two model forms were developed as part of this effort. The 217Plus model form leverages the Reliability Information Analysis Center (RIAC) 217Plus knowledge base and applies it to photonic components. It accounts for operating, nonoperating, and cycling-related failure rates so that the reliability in any operating scenario can be estimated. The model is based on failure mode and cause information (the physics-of-failure of - - the device), is stress-based, and is industry independent, incorporating best commercial practices. The second model form developed under this project is compatible with MIL-HDBK-217and has been incorporated into the newly-released MIL-HDBK-217G.