Title :
Analysis of measurement error caused by instability of reference voltage
Author :
Smerdov, A. ; Gritcuyk, O.
Author_Institution :
Lviv Polytech. Nat. Univ., Ukraine
Abstract :
Summary form only given. In the process of measuring the product of capacity and resistance through time intervals, measurement error arises caused by the reference voltage instability of the comparators. This measurement error must be evaluated and taken into account for correct analysis of the measured parameters. In this paper the measurement error caused by reference voltage instability of comparators is given.
Keywords :
capacitance measurement; electric potential; electric resistance measurement; measurement errors; stability; capacity measurement; comparators; measurement error; reference voltage instability; resistance measurement; time intervals; Electrical resistance measurement; Equations; Error analysis; Error correction; Fluctuations; Measurement errors; Time measurement; Tin; Voltage; White noise;
Conference_Titel :
CAD Systems in Microelectronics, 2001. CADSM 2001. Proceedings of the 6th International Conference. The Experience of Designing and Application of
Conference_Location :
Lviv-Slavsko, Ukraine
Print_ISBN :
966-553-079-8
DOI :
10.1109/CADSM.2001.975767
