• DocumentCode
    2084842
  • Title

    Development of fluxless flip chip bonding to a thin film multichip module substrate

  • Author

    Bonda, Rao ; Fang, Treliant ; Hileman, Ben ; Spigler, David ; Stafford, John ; Swan, Geoff ; Tam, Gordon

  • Author_Institution
    Motorola Inc., Tempe, AZ, USA
  • fYear
    1997
  • fDate
    18-21 May 1997
  • Firstpage
    875
  • Lastpage
    878
  • Abstract
    Motorola SPS has developed an assembly process for a three-chip multichip module using a fluxless bonding technique. The substrate is a 25 mm×25 mm glass that containing two layers of electroplated metallization with vias connecting the two layers and dielectric layer separating them. A test substrate is designed to characterize the continuity and leakage of the assembled modules. One of the chips has two staggered rows of 384 total bumps on the periphery with 80 μm pitch and 45 μm bump size. The other two chips have three staggered rows, 222 bumps on each chip, 210 μm pitch and 100 μm bump size. The bump composition is Pb-Sn with low Sn content. All three chips are bonded to the substrate using a fluxless plasma process followed by reflow in a nitrogen furnace. A high precision robot is used for placement and tacking of the chips on the substrate. After the bonding, the chips are underfilled with a proprietary underfill epoxy, and tested for reliability. All the reliability criteria for the specific application of this module have been met. Physical design and assembly process of this multichip module will be presented
  • Keywords
    flip-chip devices; integrated circuit reliability; microassembling; multichip modules; reflow soldering; 100 micron; 210 micron; 25 mm; 45 micron; 80 micron; Motorola SPS; PbSn; assembly process; bump composition; continuity; electroplated metallization; fluxless flip chip bonding; leakage; placement; precision robot; reflow; reliability criteria; tacking; thin film multichip module; underfill epoxy; vias; Assembly; Bonding; Dielectric substrates; Dielectric thin films; Flip chip; Glass; Metallization; Multichip modules; Testing; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1997. Proceedings., 47th
  • Conference_Location
    San Jose, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3857-X
  • Type

    conf

  • DOI
    10.1109/ECTC.1997.606272
  • Filename
    606272