DocumentCode
2084855
Title
THz time-domain magneto-optical ellipsometry in reflection geometry
Author
Ino, Y. ; Shimano, R. ; Kuwata-Gonokami, M. ; Svirko, Yu.P.
Author_Institution
Dept. of Appl. Phys., Tokyo Univ.
fYear
2004
fDate
21-21 May 2004
Firstpage
475
Lastpage
477
Abstract
We develop the THz ellipsometric technique to determine the dielectric tensor using THz time-domain magneto-optical measurements. The technique is applicable for magneto-optical measurements at an arbitrary incidence angle in materials with large magnetic anisotropy
Keywords
Kerr magneto-optical effect; dielectric function; ellipsometry; light reflection; magnetic anisotropy; tensors; THz time-domain magneto-optical ellipsometry; dielectric tensor; magnetic anisotropy; reflection geometry; Dielectric measurements; Ellipsometry; Frequency dependence; Geometry; Magnetic materials; Magnetooptic effects; Optical reflection; Physics; Tensile stress; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics Conference, 2004. (IQEC). International
Conference_Location
San Francisco, CA
Print_ISBN
1-55752-778-4
Type
conf
Filename
1366852
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