DocumentCode
2084947
Title
Fundamental theory of simulation of influencing of internal mechanical pressure on parameters of integral devices
Author
Matvijkiv, Mychajlo ; Ivasyk, Yurij
Author_Institution
Radio Eng. Fac., Nat. Univ. Lviv Polytech., Ukraine
fYear
2001
fDate
12-17 Feb. 2001
Firstpage
137
Lastpage
139
Abstract
A method of quantitative assessment of the influence of internal mechanical pressure on the parameters of integral devices is offered on the basis of the available data about the influence of pressure on parameters of the components of the integral device.
Keywords
analogue integrated circuits; circuit simulation; hybrid integrated circuits; integrated circuit modelling; integrated circuit reliability; internal stresses; stress analysis; analogue ID; hybrid module; integral device component parameters; integral device parameters; integral devices; internal mechanical pressure; linear ID; parametric reliability; quantitative assessment; simulation; Analog computers; Circuits; Finite element methods; Gold; Random variables; Stability; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
CAD Systems in Microelectronics, 2001. CADSM 2001. Proceedings of the 6th International Conference. The Experience of Designing and Application of
Conference_Location
Lviv-Slavsko, Ukraine
Print_ISBN
966-553-079-8
Type
conf
DOI
10.1109/CADSM.2001.975786
Filename
975786
Link To Document