DocumentCode :
2085023
Title :
A comparison of the robustness of reliability growth assessment techniques
Author :
Wayne, Martin ; Ellner, Paul
Author_Institution :
USAMSAA, Aberdeen Proving Ground, MD, USA
fYear :
2010
fDate :
25-28 Jan. 2010
Firstpage :
1
Lastpage :
6
Abstract :
Reliability assessment techniques constitute an important element of the reliability growth program. This paper examines the accuracy and robustness of two widely used reliability growth assessment techniques under a number of realistic corrective action processes. These methods are also compared to a newly developed assessment approach. The new approach provides a more robust assessment across a broader spectrum of cases. These include various corrective action processes as well as cases in which the number of failure modes in the system is not large compared to the number of failure modes surfaced during testing. The results indicate that each of the techniques perform acceptably well under test conditions that adhere to the assumptions on which they are based. The performance can be severely degraded when the assumptions are violated, and this is the case with the Crow-Extended Model. The AMSAA Maturity Projection Model (AMPM) and the newly developed alternate technique have a somewhat limited number of assumptions though. They appear to be more robust to the various test conditions examined here, with the alternate being the most useful across the broadest spectrum of cases.
Keywords :
reliability theory; stability; AMSAA maturity projection model; crow extended model; realistic corrective action process; reliability growth assessment technique; robust assessment; Costs; Degradation; Delay; Government; Logistics; Maximum likelihood estimation; Performance evaluation; Robustness; System testing; Weapons; AMPM; Crow-Extended Model; Reliability Growth;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
Conference_Location :
San Jose, CA
ISSN :
0149-144X
Print_ISBN :
978-1-4244-5102-9
Electronic_ISBN :
0149-144X
Type :
conf
DOI :
10.1109/RAMS.2010.5448064
Filename :
5448064
Link To Document :
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