• DocumentCode
    2085023
  • Title

    A comparison of the robustness of reliability growth assessment techniques

  • Author

    Wayne, Martin ; Ellner, Paul

  • Author_Institution
    USAMSAA, Aberdeen Proving Ground, MD, USA
  • fYear
    2010
  • fDate
    25-28 Jan. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Reliability assessment techniques constitute an important element of the reliability growth program. This paper examines the accuracy and robustness of two widely used reliability growth assessment techniques under a number of realistic corrective action processes. These methods are also compared to a newly developed assessment approach. The new approach provides a more robust assessment across a broader spectrum of cases. These include various corrective action processes as well as cases in which the number of failure modes in the system is not large compared to the number of failure modes surfaced during testing. The results indicate that each of the techniques perform acceptably well under test conditions that adhere to the assumptions on which they are based. The performance can be severely degraded when the assumptions are violated, and this is the case with the Crow-Extended Model. The AMSAA Maturity Projection Model (AMPM) and the newly developed alternate technique have a somewhat limited number of assumptions though. They appear to be more robust to the various test conditions examined here, with the alternate being the most useful across the broadest spectrum of cases.
  • Keywords
    reliability theory; stability; AMSAA maturity projection model; crow extended model; realistic corrective action process; reliability growth assessment technique; robust assessment; Costs; Degradation; Delay; Government; Logistics; Maximum likelihood estimation; Performance evaluation; Robustness; System testing; Weapons; AMPM; Crow-Extended Model; Reliability Growth;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual
  • Conference_Location
    San Jose, CA
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4244-5102-9
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2010.5448064
  • Filename
    5448064